University of Minnesota
Institute of Technology
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Murti Salapaka Web

Murti V. Salapaka

Director of Graduate Studies


Area of expertise: Control and dynamic systems and application to nano- and bio-interrogation

Ph.D., EE, 1997, University of California, Santa Barbara, CA, United States
M.S., EE, 1993, University of California, Santa Barbara, CA, United States
B.Tech., ME, 1991, Indian Institute of Technology, Madras, India

Contact information
 Office: 5-161 Keller Hall
 Telephone: (612) 625-7811
 E-mail: murtis (at)
 Personal Web Site:
 Research Group Web Site:

Dean’s fellowship for outstanding graduate performance, University of California, Santa Barbara, 1992.
CAREER Award, 1998, National Science Foundation.
ISU, Young Engineering Faculty Research Award, 2001.
Litton Chair, Electrical and Computer Engineering Department, 2002.
Students Tathagatha De and Abu Sebastian’s paper highlighted in Photonics magazine, 2005.
Thermally Driven Non-contact Atomic Force Microscopy highlighted in Nature, September 22, 2005.
Student, Deepak Sahoo’s paper, selected one of the top 5 papers at the American Control Conference, 2007.
Keynote Lecture “Control and Systems Approaches to Atomic Force Microscopy”, International Federation of Automatic Control (IFAC), 17th IFAC World Congress, July 6-11, 2008, Seoul, Korea

Prof. Salapaka research spans control theory and its applications to nano-interrogation and bio-manipulation at the molecular scale using laser tweezers and atomic force microscopes

Selected publications
Tathagata De, Pranav Agarwal, Deepak R. Sahoo, and Murti V. Salapaka. "Real-time detection of probe loss in atomic force microscopy". Applied Physics Letters, 89 (2006): 133119.

Anil Gannepalli, Abu Sebastian, Jason Cleveland, and M. V. Salapaka. "Thermally driven non-contact atomic force microscopy". Applied Physics Letters, 87.11 (2005): 111901.

Xin Qi(s), M. V. Salapaka, Petros G. Voulgaris, and Mustafa Khammash. "Structured optimal and robust control with multiple criteria: A convex solution". IEEE Transactions on Automatic Control, 49.10 (October 2004): 1623-1640.