Stephen A. Campbell
Professor
Presidential Young Investigator
B.A., 1975, Physics, College of St. Thomas
M.S., 1978, Physics, Northwestern University
Ph.D., 1978, Physics, Northwestern University
Telephone: (612) 625-5876
E-mail: campbell@ece.umn.edu
Web Page: http://www.ece.umn.edu/users/campbell/
My research interests include materials and fabrication
processes required for very high speed silicon based
structures. In one project our group is developing large diameter semi-
insulating silicon substrates that will allow the design and fabrication of
extremely competitive silicon microwave integrated circuits. This is
done by introducing and suitably confined Fermi level pinning impurities
in silicon wafers. We are very active in the area of dielectrics for deeply
scaled MOSFETs. Working with industry collaborators we are
developing optimal wet and dry cleaning processes for preoxidation
surface preparation. With collaborators in Chemistry and Materials
Science our group is investigating the use of MOCVD for the deposition
of high permitivity materials for the gate insulator. With these materials
we have built the
world's first MOSFETs using high permitivity layers and have observed
such interesting device effects as the quantum capacitance of the
accumulation layer. Finally we have a very active and vigorous
collaboration with the Mechanical Engineering Department in the
detection of very small particles in the vacuum chambers of processing
equipment. We are able to detect and size particles as small as 40 A
in diameter and in densities approaching 10 cm^-3.
Selected Publications
S. A. Campbell, The Science and Technology of Microelectronic
Fabrication, Oxford, 1996.
"A Critical Review - The Epitaxial Growth of Semiconductors By Rapid
Thermal Chemical Vapor Deposition" accepted for publication,
Materials Research Reviews.
"Particle Beam Mass Spectrometer Measurements of Particle
Formation During LPCVD of Polysilicon and SiO2 Films", P. H. McMurry,
S. Nijhawan, N. Rao, P. Ziemann, S. A. Campbell, and D. B. Kittleson,
submitted to J. Vac. Sci. and Techn.
"Structural and Electrical Characterization of TiO2 Grown from Titanium
Tetrakis-isopropoxide (TTIP) and TTIP/H2O Ambients", J. Yan, D. C.
Gilmer, S. A. Campbell, and W. L. Gladfelter, accepted for publication,
J. Vac. Sci. Techn. B
"Semi-Insulating Silicon", S. A. Campbell and J. Meyer, Proceedings of
the 1995 Silicon on Insulator Workshop, IEEE (1995).